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156	"A Statistic-based Scan Chain Reordering for Energy-Quality Scalable Scan Test " Sungyoul Seo, Keewon Cho, Young-woo Lee, Sungho Kang IEEE Journal on Emerging and Selected Topics in Circuits and Systems vol.8, no.3, pp 391-403, September 2018
155	"A debug scheme to improve the error identification in post-silicon validation" Inhyuk Choi, Won Jung, Hyunggoy Oh, Sungho Kang PLoS One vol.13, no.9, e0202216, September 2018
154	"Fault Group Pattern Matching with Efficient Early Termination for High-Speed Redundancy Analysis" Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.37, no.7, pp.1473-1482, July 2018
153	"Thermal Aware Test Scheduling for NTV Circuit " Jaeil Lim, Hyunggoy Oh, Heetae Kim, Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.37, no.4, pp.906-910, March 2018
152	"Fast Built-in Redundancy Analysis Based on Sequential Spare Line Allocation" Hayoung Lee, Jooyoung Kim, Keewon Cho, Sungho Kang IEEE Transactions on Reliability vol.67, no.1, pp.264-273, March 2018
151	"An Area-efficient BIRA with 1D Spare Segments" Donghyun Kim, Hayoung Lee, Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.26, no.1, pp.206-210, January 2018
150	"A novel X-filling method for capture power reduction" Heetae Kim, Hyunggoy Oh, Jaeil Lim, Sungho Kang IEICE Electronics Express (ELEX) vol.14, no.23, pp.1-6, November 2017
149	"Grouping-based TSV Test Architecture for Resistive Open and Bridge Defects in 3D-ICs" Young-woo Lee, Hyeonchan Lim, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.36, no.10, pp.1759-1763, October 2017
148	"DRAM-based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores" Hyunggoy Oh, Inhyuk Choi, Sungho Kang IEEE Transactions on Computers vol.66, no.9, pp.1504-1517, September 2017
147	"DVFS-aware refresh management for 3D DRAM over processor architecture " Jaeil Lim, Heetae Kim, Hyunggoy Oh, Sungho Kang IET Electronics Letters vol.53,no.14, pp.910-912, July 2017

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