board

172	"A New Logic Topology-based Scan Chain Stitching for Test-Power Reduction" Sangjun Lee, Kyunghwan Cho, Sungki Choi, and Sungho Kang IEEE Transactions on Circuits and Systems II: Express Briefs vol.67, no.12, pp.3432-3436, December 2020
171	"Prediction based Error Correction for GPU Reliability with Low Overhead" Hyunyul Lim, Tae Hyun Kim, Sungho Kang Electronics vol.9, no.11, pp.1849, November 2020
170	"Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks" Young-woo Lee, Hyeonchan Lim, Youngkwang Lee, Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.39, no.10, pp.3023-3034, October 2020
169	"Fine-Grained Defect Diagnosis for CMOL FPGA Circuits" Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang IEEE Access vol.8, pp.163140-163151, September 2020
168	"A 3-D Rotation-Based Through-Silicon Via Redundancy Architecture for Clustering Faults" Minho Cheong, Ingeol Lee, Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.39, no.9, pp.1925-1934, September 2020
167	"Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks" Hyunyul Lim, Minho Cheong, Sungho Kang Sensors vol.20, no.17, pp.4771, September 2020
166	"Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing" Sungyoul Seo, Young-woo Lee, Hyeonchan Lim, Sungho Kang IEEE transactions on Semiconductor Manufacturing vol.33, no.3, pp.391-403, August 2020
165	"GPU-Based Redundancy Analysis Using Concurrent Evaluation" Taehyun Kim, Hayoung Lee, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.28, no.3, pp.805-817, March 2020
164	"Efficient Systolic-Array Redundancy Architecture for Offline/Online Repair" Keewon Cho, Ingeol Lee, Hyeonchan Lim, and Sungho Kang Electronics-Open Access Journal vol.9, no.2, pp.338, February 2020
163	"Dynamic Built-In Redundancy Analysis for Memory Repair" Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.27, no.10, pp.2365-2374, June 2019

[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] Next Page>>