154 |
"Fault Group Pattern Matching with Efficient Early Termination for High-Speed Redundancy Analysis"
|
153 |
"Thermal Aware Test Scheduling for NTV Circuit "
|
152 |
"Fast Built-in Redundancy Analysis Based on Sequential Spare Line Allocation"
|
151 |
"An Area-efficient BIRA with 1D Spare Segments"
|
150 |
"A novel X-filling method for capture power reduction"
|
149 |
"Grouping-based TSV Test Architecture for Resistive Open and Bridge Defects in 3D-ICs"
|
148 |
"DRAM-based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores"
|
147 |
"DVFS-aware refresh management for 3D DRAM over processor architecture "
|
146 |
"Reconfigurable scan architecture for Test Power and Data Volume Reduction"
|
145 |
"Proof of Concept of Home IoT Connected Vehicles"
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