164 |
"Efficient Systolic-Array Redundancy Architecture for Offline/Online Repair"
|
163 |
"Dynamic Built-In Redundancy Analysis for Memory Repair"
|
162 |
"A Low-cost Concurrent TSV Test Architecture with Lossless Test Output Compression Scheme"
|
161 |
"Test Friendly Data Selectable Self-Gating (DSSG)"
|
160 |
"Highly Reliable Redundant TSV Architecture for Clustered Faults"
|
159 |
"An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults"
|
158 |
"TSV Repair Architecture for Clustered Faults"
|
157 |
"Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost"
|
156 |
"A Statistic-based Scan Chain Reordering for Energy-Quality Scalable Scan Test "
|
155 |
"A debug scheme to improve the error identification in post-silicon validation"
|
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