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169	"Fine-Grained Defect Diagnosis for CMOL FPGA Circuits" Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang IEEE Access vol.8, pp.163140-163151, September 2020
168	"A 3-D Rotation-Based Through-Silicon Via Redundancy Architecture for Clustering Faults" Minho Cheong, Ingeol Lee, Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.39, no.9, pp.1925-1934, September 2020
167	"Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks" Hyunyul Lim, Minho Cheong, Sungho Kang Sensors vol.20, no.17, pp.4771, September 2020
166	"Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing" Sungyoul Seo, Young-woo Lee, Hyeonchan Lim, Sungho Kang IEEE transactions on Semiconductor Manufacturing vol.33, no.3, pp.391-403, August 2020
165	"GPU-Based Redundancy Analysis Using Concurrent Evaluation" Taehyun Kim, Hayoung Lee, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.28, no.3, pp.805-817, March 2020
164	"Efficient Systolic-Array Redundancy Architecture for Offline/Online Repair" Keewon Cho, Ingeol Lee, Hyeonchan Lim, and Sungho Kang Electronics-Open Access Journal vol.9, no.2, pp.338, February 2020
163	"Dynamic Built-In Redundancy Analysis for Memory Repair" Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.27, no.10, pp.2365-2374, June 2019
162	"A Low-cost Concurrent TSV Test Architecture with Lossless Test Output Compression Scheme" Young-woo Lee, Hyeonchan Lim, Sungyoul Seo, Keewon Cho, Sungho Kang Public Library of Science One vol.14, no.8, pp e0221043, August 2019
161	"Test Friendly Data Selectable Self-Gating (DSSG)" Jihye Kim, Sangjun Lee, Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.27, no.8, pp.1972-1976, August 2019
160	"Highly Reliable Redundant TSV Architecture for Clustered Faults" Ingeol Lee, Minho Cheong, Sungho Kang IEEE Transactions on Reliability vol.68, no.1, pp.237-247, March 2019

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