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191	"Shift Left Quality Management System (QMS) Using a 3D Matrix Scanning Method on System on a Chip" Yong Lee, Seokjun Jang, Sungho Kang IEEE Transactions on Circuits and Systems II: Express Briefs vol.70, no.4, pp.1580-1584, April 2023
190	"TSV Built-In Self-Repair Architecture for Improving the Yield and Reliability of HBM" Youngkwang Lee, Donghyun Han, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.31, no.4, pp.578-590, April 2023
189	"Novel Error-Tolerant Voltage-Divider-Based Through-Silicon-Via Test Architecture" Youngkwang Lee, Donghyun Han, Sooryeong Lee, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.42, no.1, pp.308-321, January 2023
188	"A Hybrid Test Scheme for Automotive IC in Multi-site Testing" Hyeonchan Lim, Hyojoon Yun, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.41, no.12, pp.5671-5680, December 2022
187	"Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis" Hyeonchan Lim, Hyojoon Yun, Sungho Kang IEEE Transactions on Circuits and Systems II: Express Briefs vol.69, no.11, pp.4498-4502, November 2022
186	"SPAR: A New Test Point Insertion Using Shared Points for Area Overhead Reduction" Gyungbin Kim, Minho Cheong, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.41, no.11, pp.4939-4951, November 2022
185	"Multi-Bank Optimized Redundancy Analysis Using Efficient Fault Collection" Hogyeong Kim, Hayoung Lee, Donghyun Han, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.41, no.8, pp.2739-2752, August 2022
184	"ECMO: ECC Architecture Reusing Content Addressable Memories for Obtaining High Reliability in DRAM" Hayoung Lee, Younwoo Yoo, Seung Ho Shin, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.30, no.6, pp.781-793, June 2022
183	"Herringbone Based TSV Architecture for Clustered Fault Repair and Aging Recovery" Sangmin Park, Minho Cheong, Donghyun Han, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.41, no.4, pp.1142-1153, April 2022
182	"Reduced-Pin-Count BOST for Test-Cost Reduction" Youngkwang Lee, Young-woo Lee, Sungyoul Seo, Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.41, no.3, pp.750-761, March 2022

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