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194	"STRAIT: Self-Test and Self-Recovery for AI Accelerator" Hayoung Lee, Jihye Kim, Jongho Park, Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.42, no.9, pp.3092-3104, September 2023,
193	"Scan Chain Architecture with Data Duplication for Multiple Scan Cell Fault Diagnosis" Sunghoon Kim, Seokjun Jang, Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.42, no.8, pp.2717-2727, August 2023,
192	"TRUST: Through-Silicon Via Repair Using Switch Matrix Topology" Hayoung Lee, Seung Ho Shin, Younwoo Yoo, Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.42, no.7, pp.2377-2390, July 2023,
191	"Shift Left Quality Management System (QMS) Using a 3D Matrix Scanning Method on System on a Chip" Yong Lee, Seokjun Jang, Sungho Kang IEEE Transactions on Circuits and Systems II: Express Briefs vol.70, no.4, pp.1580-1584, April 2023
190	"TSV Built-In Self-Repair Architecture for Improving the Yield and Reliability of HBM" Youngkwang Lee, Donghyun Han, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.31, no.4, pp.578-590, April 2023
189	"Novel Error-Tolerant Voltage-Divider-Based Through-Silicon-Via Test Architecture" Youngkwang Lee, Donghyun Han, Sooryeong Lee, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.42, no.1, pp.308-321, January 2023
188	"A Hybrid Test Scheme for Automotive IC in Multi-site Testing" Hyeonchan Lim, Hyojoon Yun, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.41, no.12, pp.5671-5680, December 2022
187	"Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis" Hyeonchan Lim, Hyojoon Yun, Sungho Kang IEEE Transactions on Circuits and Systems II: Express Briefs vol.69, no.11, pp.4498-4502, November 2022
186	"SPAR: A New Test Point Insertion Using Shared Points for Area Overhead Reduction" Gyungbin Kim, Minho Cheong, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.41, no.11, pp.4939-4951, November 2022
185	"Multi-Bank Optimized Redundancy Analysis Using Efficient Fault Collection" Hogyeong Kim, Hayoung Lee, Donghyun Han, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.41, no.8, pp.2739-2752, August 2022

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