206

"A New Pipelined Output Data Reducer of BOST for Improved Parallelism"
Sooryeong Lee, Hayoung Lee, Juyong Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.2, pp.765-776, February 2025

205

"RAPID Redundancy Analysis with Parallelized and Intelligent Distribution"
Younwoo Yoo, Hayoung Lee, Seung Ho Shin, and Sungho Kang
IEEE Access
vol. 13, pp. 2089-2100, January 2025

204

"PASS: Pattern-Sequence-Authentication-based Secure Scan against Reverse Engineering Attacks"
Seokjun Jang, Youngki Moon, Duyeon Won, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.1, pp.52-64, January 2025

203

"PETRA: Powerful Early Termination based Redundancy Analysis"
Youngkwang Lee, Hyojoon Yun, Younwoo Yoo, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.1, pp.345-356, January 2025

202

"An Efficient Scan Diagnosis for Intermittent Faults using CNN with Multi-Channel Data"
Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, Doohyun Yoon, Sungho Kang
IEEE Access
vol.12, pp.146463 - 146475, October 2024

201

"An Area-Efficient Systolic Array Redundancy Architecture for Reliable AI Accelerator"
Hayoung Lee, Jongho Park, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.32, no.10, pp.1950-1954, October 2024

200

"GRAP: Efficient GPU-based Redundancy Analysis Using Parallel Evaluation for Cross Faults"
Seung-Ho Shin, Hayoung Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.43, no.8, pp.2518-2531, August 2024

199

"A New ISA for High-Speed and Area-Efficient ALPG"
Juyong Lee, Hayoung Lee, Sooryeong Lee, and Sungho Kang
IEEE Transactions on Circuits and Systems II: Express Briefs
vol.71, no.7. pp.3358-3362, July 2024

198

"RA-Aware Fail Data Collection Architecture for Cost Reduction"
Hayoung Lee, Sooryeong Lee, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.32, no.6, pp.1136-1149, June 2024

197

"A New Zero-Overhead Test Method for Low-Power AI Accelerators"
Sangjun Lee, Jongho Park, Sungwhan Park, Hyemin Kim, and Sungho Kang
IEEE Transactions on Circuits and Systems II: Express Briefs
vol.71, no.5, pp.2649-2653, May 2024