203

"PETRA: Powerful Early Termination based Redundancy Analysis"
Youngkwang Lee, Hyojoon Yun, Younwoo Yoo, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.1, pp.345-356, January 2025

202

"An Efficient Scan Diagnosis for Intermittent Faults using CNN with Multi-Channel Data"
Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, Doohyun Yoon, Sungho Kang
IEEE Access
vol.12, pp.146463 - 146475, October 2024

201

"An Area-Efficient Systolic Array Redundancy Architecture for Reliable AI Accelerator"
Hayoung Lee, Jongho Park, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.32, no.10, pp.1950-1954, October 2024

200

"GRAP: Efficient GPU-based Redundancy Analysis Using Parallel Evaluation for Cross Faults"
Seung-Ho Shin, Hayoung Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.43, no.8, pp.2518-2531, August 2024

199

"A New ISA for High-Speed and Area-Efficient ALPG"
Juyong Lee, Hayoung Lee, Sooryeong Lee, and Sungho Kang
IEEE Transactions on Circuits and Systems II: Express Briefs
vol.71, no.7. pp.3358-3362, July 2024

198

"RA-Aware Fail Data Collection Architecture for Cost Reduction"
Hayoung Lee, Sooryeong Lee, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.32, no.6, pp.1136-1149, June 2024

197

"A New Zero-Overhead Test Method for Low-Power AI Accelerators"
Sangjun Lee, Jongho Park, Sungwhan Park, Hyemin Kim, and Sungho Kang
IEEE Transactions on Circuits and Systems II: Express Briefs
vol.71, no.5, pp.2649-2653, May 2024

196

"A New Fail Address Memory Architecture for Cost-Effective ATE"
Hayoung Lee, Sooryeong Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.43, no.4, pp.1260-1273, April 2024

195

"Reconfigurable Multi-bit Scan Flip-Flop for Cell-Aware Diagnosis"
Hyeonchan Lim, Taehyun Kim, and Sungho Kang
IEEE Transactions on Circuits and Systems II: Express Briefs
vol.71, no.4, pp.2024-2028, April 2024

194

"STRAIT: Self-Test and Self-Recovery for AI Accelerator"
Hayoung Lee, Jihye Kim, Jongho Park, Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.42, no.9, pp.3092-3104, September 2023, September 2023