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213	"A Robust Test Architecture for Low-Power AI Accelerators" Hayoung Lee, Juyong Lee, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.44, no.4, pp.1581-1594, April 2025
212	"SPOT: Fast and Optimal Built-In Redundancy Analysis using Smart Potential Case Collection" Donghyun Han, Sunghoon Kim, Dayoung Kim, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.33, no.3, pp.780-792, March 2025
211	"A Cost-Effective Per-Pin ALPG for High-Speed Memory Testing" Juyong Lee, Hayoung Lee, Sooryeong Lee, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.33, no.3, pp.867-871, March 2025
210	"An Efficient Low Power BIST for Automotive SoC with Periodic Pattern Type Selection" Jongho Park, Sangjun Lee, Hyemin Kim, Jaeyoung Joung, Jaehyun Kim, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.44, no.3, pp.1169-1179, March 2025
209	"Low Cost TSV Repair Architecture Using Switch-Based Matrix for Highly Clustered Faults" Seokjun Jang, Donghyun Han, Sunghoon Kim, Dayoung Kim, and Sungho Kang IEEE Access vol.13, pp.30722-30731, February 2025
208	"A Novel Prediction-Based Two-Tiered ECC for Mitigating SWD Errors in HBM" Youngki Moon, Seung Ho Shin, Seokjun Jang, Duyeon Won, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.33, no.2, pp.488-498, February 2025
207	"Effective Parallel Redundancy Analysis Using GPU for Memory Repair" Seung Ho Shin, Hayoung Lee, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.33, no.2, pp.462-474, February 2025
206	"A New Pipelined Output Data Reducer of BOST for Improved Parallelism" Sooryeong Lee, Hayoung Lee, Juyong Lee, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.44, no.2, pp.765-776, February 2025
205	"RAPID Redundancy Analysis with Parallelized and Intelligent Distribution" Younwoo Yoo, Hayoung Lee, Seung Ho Shin, and Sungho Kang IEEE Access vol. 13, pp. 2089-2100, January 2025
204	"PASS: Pattern-Sequence-Authentication-based Secure Scan against Reverse Engineering Attacks" Seokjun Jang, Youngki Moon, Duyeon Won, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.44, no.1, pp.52-64, January 2025

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