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"Multi-stage Enhanced Diagnosis with Fault Candidate Reduction"
Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.9, pp.3648-3652, September 2025

218

"An Efficient Test Scheduling Method based on Dynamic Pairing"
Heetae Kim, Hyojoon Yun, Doohyun Yoon, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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217

"A Novel CNN-based Redundancy Analysis Using Parallel Solution Decision"
Seung Ho Shin, Minho Cheong, Hayoung Lee, Byungsoo Kim, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.7, pp.2789-2802, July 2025

216

"A New Test Point Insertion Using Weight Adjusted Grouping"
Jaehyun Kim, Hyemin Kim, Jongho Park, Sangjun Lee, and Sungho Kang
IEEE Access
vol.13, pp.2169-3536, June 2025

215

"An Efficient Test Architecture Using Hybrid Built-In Self-Test for Processing-In-Memory "
Hayoung Lee, Juyong Lee, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.33, no.5, pp.1452-1456, May 2025

214

"A Built-In Self-Repair with Maximum Fault Collection and Fast Analysis Method for HBM"
Joonsik Yoon, Hayoung Lee, Youngki Moon, Seung Ho Shin, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.5, pp.2014-2025, May 2025

213

"A Robust Test Architecture for Low-Power AI Accelerators"
Hayoung Lee, Juyong Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.4, pp.1581-1594, April 2025

212

"SPOT: Fast and Optimal Built-In Redundancy Analysis using Smart Potential Case Collection"
Donghyun Han, Sunghoon Kim, Dayoung Kim, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.33, no.3, pp.780-792, March 2025

211

"A Cost-Effective Per-Pin ALPG for High-Speed Memory Testing"
Juyong Lee, Hayoung Lee, Sooryeong Lee, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.33, no.3, pp.867-871, March 2025

210

"An Efficient Low Power BIST for Automotive SoC with Periodic Pattern Type Selection"
Jongho Park, Sangjun Lee, Hyemin Kim, Jaeyoung Joung, Jaehyun Kim, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.3, pp.1169-1179, March 2025