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221	"A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency" Jongho Park, Sangjun Lee, Jaehyun Kim, Hanseong Cho, Nayeun Kim, and Sungho Kang IEEE Access vol.13, pp.180264-180275, October 2025
220	"TSV Built-In Self-Repair Architecture for Lifespan Reliability Enhancement of HBM" Donghyun Han, Duyeon Won, Sunghoon Kim, and Sungho Kang IEEE Transactions on Reliability vol.74, no.3, pp.4143-4157, September 2025
219	"Multi-stage Enhanced Diagnosis with Fault Candidate Reduction" Hyojun Yun, Hyeonchan Lim, Hayoung Lee, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.44, no.9, pp.3648-3652, September 2025
218	"An Efficient Test Scheduling Method based on Dynamic Pairing" Heetae Kim, Hyojun Yun, Doohyun Yoon, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.44, no.9, pp.3606-3616, September 2025
217	"A Novel CNN-based Redundancy Analysis Using Parallel Solution Decision" Seung Ho Shin, Minho Cheong, Hayoung Lee, Byungsoo Kim, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.44, no.7, pp.2789-2802, July 2025
216	"A New Test Point Insertion Using Weight Adjusted Grouping" Jaehyun Kim, Hyemin Kim, Jongho Park, Sangjun Lee, and Sungho Kang IEEE Access vol.13, pp.2169-3536, June 2025
215	"An Efficient Test Architecture Using Hybrid Built-In Self-Test for Processing-In-Memory " Hayoung Lee, Juyong Lee, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.33, no.5, pp.1452-1456, May 2025
214	"A Built-In Self-Repair with Maximum Fault Collection and Fast Analysis Method for HBM" Joonsik Yoon, Hayoung Lee, Youngki Moon, Seung Ho Shin, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.44, no.5, pp.2014-2025, May 2025
213	"A Robust Test Architecture for Low-Power AI Accelerators" Hayoung Lee, Juyong Lee, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.44, no.4, pp.1581-1594, April 2025
212	"SPOT: Fast and Optimal Built-In Redundancy Analysis using Smart Potential Case Collection" Donghyun Han, Sunghoon Kim, Dayoung Kim, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.33, no.3, pp.780-792, March 2025

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