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136	"A New 3-D Fuse Architecture to Improve Yield of 3-D Memories" Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.35, no.10, pp.1763-1767, October 2016
135	"Parallelized Network on Chip-reused Test Access Mechanism for Multiple Identical Cores" Taewoo Han, Inhyuk Choi, Hyunggoy Oh, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems vol.35, no.7, pp.1219-1223, July 2016
134	"Optimized Built-in Self Repair for Multiple Memories" Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.24, no.6, pp.2174-2183, June 2016
133	"Tri-State Coding using Reconfiguration of Twisted Ring Counter for Test Data Compression" Sungyoul Seo, Yong Lee, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) vol.35, no.2, pp.274-284, February 2016
132	"Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability" Hyejeong Hong, Jaeil Lim, Hyunyul Lim, and Sungho Kang ACM Computing Surveys vol.48, no.1, pp.9:1-9:25, September 2015
131	"3D Stacked DRAM Refresh Management with Guaranteed Data Reliability" Jaeil Lim,Hyunyul Lim, and Sungho Kang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) vol.34, no.9, pp.1455-1466, September 2015
130	"Fully Programmable Memory BIST for Commodity DRAMs" Ilwoong Kim, Woosik Jeong, Dongho Kang, and Sungho Kang ETRI Journal vol.37, no.4, pp.787-792, August 2015
129	"A New Accelerated Endurance Test for Terabit NAND Flash Memory using Interference Effect" Jaewon Cha and Sungho Kang IEEE Transactions on Semiconductor Manufacturing vol.28, no.3, pp.399-407, August 2015
128	"Majority based Test Access Mechanism for Parallel Testing of Multiple Identical Cores" Taewoo Han, Inhyuk Choi, and Sungho Kang IEEE Transactions on Very Large Scale Integration Systems vol.23, no.8, pp.1439-1447, August 2015
127	"Eco Assist Techniques through Real-time Monitoring of BEV Energy Usage Efficiency" Younsun Kim, Ingeol Lee, and Sungho Kang Sensors vol.15, no.7, pp.14946-14959, July 2015

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