234

"Memory-Optimized Block Compression for High-Speed Memory Testing"
Gyeonggyu Park, Duyeon Won, Juyong Lee, Youngki Moon, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
To be Published

233

"A Pre-Load Compression Using Test Vector Segmentation for High-Speed Memory Testing"
Duyeon Won, Juyong Lee, Gyeonggyu Park, Youngki Moon, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be Published

232

"An Area-Efficient Hybrid Architecture for High-Speed ALPG"
Juyong Lee, Duyeon Won, Gyeonggyu Park, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
To be Published

231

"High-Speed Redundancy Analysis for Complex Spare Structures"
Youngkwang Lee, Younwoo Yoo, Seung Ho Shin, Byungsoo Kim, Eugene Jeong, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be Published

230

"Evolution of Obfuscation-Based Scan Design Techniques"
Seokjun Jang, Youngki Moon, Duyeon Won, Wonjun Kim, and Sungho Kang
ACM Computing Surveys
vol.58, no.11, pp.1-34, April 2026

229

"A Dual-Mode Online BISR Architecture for Interconnect and Memory Repair in Chiplet-Based Systems"
Donghyun Han, Sooryeong Lee, Jongho Park, Dayoung Kim, Seungtae Kim, Youngkwang Lee and Sungho Kang
IEEE Transactions on Reliability
vol.75, pp.1525-1539, April 2026

228

"STAR-PIM: Self-Test and Repair Structure for Processing-in Memory with Adder Tree-Based MAC"
Seung Ho Shin, Younwoo Yoo, Youngki Moon, Nuri Son, Dahoon Kim, and Sungho Kang
IEEE Transactions on Circuits and Systems I: Regular Papers
vol.73, no.3, pp.1990-2003, March 2026

227

"A Low Area Built-In Self-Repair Using Hybrid Fault Address Memory for HBM"
Byungsoo Kim, Seung Ho Shin, Youngki Moon, Eugene Jeong, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.34, no.3, pp.991-1003, March 2026

226

"FADE: Fault-Aware Adaptive On-Die ECC for Improving Robustness"
Youngki Moon, Juyong Lee, Nayeun Kim, Yeonho Choi, Byungsoo Kim, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.34, no.2, pp.707-710, February 2026

225

"CLAPS: A Graph Clustering Based Approach for Partial Scan Design"
Jaeyoung Joung, Sangjun Lee, Jongho Park, Jaehyun Kim, Laesang Jung, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.45, no.1, pp.396-406, January 2026