237

"PRAISE: Parallel Redundancy Analysis Using Isomorphism-Based Solution Encoding"
Younwoo Yoo, Seung Ho Shin, Dahoon Kim, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
To be Published

236

"Deep-Learning-Based PRPG Configuration Inference for Efficient LBIST"
Hanseong Cho, Jongho Park, Jaehyun Kim, Laesang Jung, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
To be Published

235

"Subarray-Based Victim-Centric Per-Row Counting for Mitigating RowHammer"
Hwayoung Jeong, Juyong Lee, Hayoung Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be Published

234

"A Pre-Load Compression Using Test Vector Segmentation for High-Speed Memory Testing"
Duyeon Won, Juyong Lee, Gyeonggyu Park, Youngki Moon, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be Published

233

"High-Speed Redundancy Analysis for Complex Spare Structures"
Youngkwang Lee, Younwoo Yoo, Seung Ho Shin, Byungsoo Kim, Eugene Jeong, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be Published

232

"Memory-Optimized Block Compression for High-Speed Memory Testing"
Gyeonggyu Park, Duyeon Won, Juyong Lee, Youngki Moon, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.34, no.7, pp. 2284-2295, July 2026

231

"An Area-Efficient Hybrid Architecture for High-Speed ALPG"
Juyong Lee, Duyeon Won, Gyeonggyu Park, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.34, no.5, pp.1500-1513, May 2026

230

"Evolution of Obfuscation-Based Scan Design Techniques"
Seokjun Jang, Youngki Moon, Duyeon Won, Wonjun Kim, and Sungho Kang
ACM Computing Surveys
vol.58, no.11, pp.1-34, April 2026

229

"A Dual-Mode Online BISR Architecture for Interconnect and Memory Repair in Chiplet-Based Systems"
Donghyun Han, Sooryeong Lee, Jongho Park, Dayoung Kim, Seungtae Kim, Youngkwang Lee and Sungho Kang
IEEE Transactions on Reliability
vol.75, pp.1525-1539, April 2026

228

"STAR-PIM: Self-Test and Repair Structure for Processing-in Memory with Adder Tree-Based MAC"
Seung Ho Shin, Younwoo Yoo, Youngki Moon, Nuri Son, Dahoon Kim, and Sungho Kang
IEEE Transactions on Circuits and Systems I: Regular Papers
vol.73, no.3, pp.1990-2003, March 2026