225

"STAR-PIM: Self-Test and Repair Structure for Processing-in Memory with Adder Tree-Based MAC"
Seung Ho Shin, Younwoo Yoo, Youngki Moon, Nuri Son, Dahoon Kim, and Sungho Kang
IEEE Transactions on Circuits and Systems I: Regular Papers
To Be Published

224

"Test Cycle Reduction for TSV Test Using Streaming Scan Network on 3-D IC"
Sunghoon Kim, Donghyun Han, Dayoung Kim, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
To Be Published

223

"TOPS: Topology-based Partial Scan for Stuck-at and Delay Testing"
Sangjun Lee, Jongho Park, Jaeyoung Joung, Jaehyun Kim, Laesang Jung, and Sungho Kang
IEEE Transactions on Circuits and Systems I: Regular Papers
To be Published

222

"VASE: Vector Memory Using Bit-Level Address Segmentation for High-Speed Memory Testing"
Sooryeong Lee, Juyong Lee, Hayoung Lee, and Sungho Kang
IEEE Transactions on Circuits and Systems I: Regular Papers
To be Published

221

"CLAPS: A Graph Clustering Based Approach for Partial Scan Design"
Jaeyoung Joung, Sangjun Lee, Jongho Park, Jaehyun Kim, Laesang Jung, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be Published

220

"TSV Built-In Self-Repair Architecture for Lifespan Reliability Enhancement of HBM"
Donghyun Han, Duyeon Won, Sunghoon Kim, and Sungho Kang
IEEE Transactions on Reliability
vol.74, no.3, pp.4143-4157, September 2025

219

"Multi-stage Enhanced Diagnosis with Fault Candidate Reduction"
Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.9, pp.3648-3652, September 2025

218

"An Efficient Test Scheduling Method based on Dynamic Pairing"
Heetae Kim, Hyojoon Yun, Doohyun Yoon, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.9, pp.3606-3616, September 2025

217

"A Novel CNN-based Redundancy Analysis Using Parallel Solution Decision"
Seung Ho Shin, Minho Cheong, Hayoung Lee, Byungsoo Kim, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.7, pp.2789-2802, July 2025

216

"A New Test Point Insertion Using Weight Adjusted Grouping"
Jaehyun Kim, Hyemin Kim, Jongho Park, Sangjun Lee, and Sungho Kang
IEEE Access
vol.13, pp.2169-3536, June 2025