219

"Multi-stage Enhanced Diagnosis with Fault Candidate Reduction"
Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be Published

218

"An Efficient Test Scheduling Method based on Dynamic Pairing"
Heetae Kim, Hyojoon Yun, Doohyun Yoon, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be Published

217

"A Novel CNN-based Redundancy Analysis Using Parallel Solution Decision"
Seung Ho Shin, Minho Cheong, Hayoung Lee, Byungsoo Kim, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be Published

216

"An Efficient Test Architecture Using Hybrid Built-In Self-Test for Processing-In-Memory "
Hayoung Lee, Juyong Lee, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
To be Published

215

"A Built-In Self-Repair with Maximum Fault Collection and Fast Analysis Method for HBM"
Joonsik Yoon, Hayoung Lee, Youngki Moon, Seung Ho Shin, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
To be Published

214

"TSV Built-In Self-Repair Architecture for Lifespan Reliability Enhancement of HBM"
Donghyun Han, Duyeon Won, Sunghoon Kim, and Sungho Kang
IEEE Transactions on Reliability
To be Published

213

"A Robust Test Architecture for Low-Power AI Accelerators"
Hayoung Lee, Juyong Lee, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.4, pp.1581-1594, April 2025

212

"SPOT: Fast and Optimal Built-In Redundancy Analysis using Smart Potential Case Collection"
Donghyun Han, Sunghoon Kim, Dayoung Kim, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.33, no.3, pp.780-792, March 2025

211

"A Cost-Effective Per-Pin ALPG for High-Speed Memory Testing"
Juyong Lee, Hayoung Lee, Sooryeong Lee, and Sungho Kang
IEEE Transactions on Very Large Scale Integration Systems
vol.33, no.3, pp.867-871, March 2025

210

"An Efficient Low Power BIST for Automotive SoC with Periodic Pattern Type Selection"
Jongho Park, Sangjun Lee, Hyemin Kim, Jaeyoung Joung, Jaehyun Kim, and Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
vol.44, no.3, pp.1169-1179, March 2025