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 126  | 
 "¼öÀ² Çâ»óÀ» À§ÇÑ Layout-Aware Scan Chain Diagnosis"  | 
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 125  | 
 "½ÅÈ£ Áö¿¬À» ÃÖ¼ÒÈÇÏ´Â TSV ¼ö¸® ±¸Á¶"  | 
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 124  | 
 "¸Þ¸ð¸® ¹ÝµµÃ¼ peri ¿µ¿ªÀ» À§ÇÑ DFT ±â¹Ý Å×½ºÆ® ¹æ¹ý"  | 
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 123  | 
 "Â÷·®¿ë SoC¸¦ À§ÇÑ °í½Å·Ú¼º ÀÚ°¡ Å×½ºÆ® ±â¼ú"  | 
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 122  | 
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 121  | 
 "Ãʰí¼Ó ¸Þ¸ð¸®-½Ã½ºÅÛ(CK 8GHz, DQ 16Gbps) Àåºñ ±¸Á¶ °³¹ß"  | 
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 120  | 
 "SoC ¹ÝµµÃ¼ÀÇ °íǰÁú º´·Ä Å×½ºÆ® ÀåºñÀÇ ¿øÃµ ±â¼ú °³¹ß"  | 
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 119  | 
 "Â÷¼¼´ë ¸Þ¸ð¸® Å×½ºÆ® ±â¼ú °³¹ß"  | 
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 118  | 
 "DRAM ±â¹Ý ¸Þ¸ð¸® °èÃþ ±¸Á¶ ¼³°è ¹× ÀÀ¿ë"  | 
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 117  | 
 "½ÇÁ¾¾Æµ¿µî ½Å¿øÈ®ÀÎÀ» À§ÇÑ º¹ÇÕÀÎÁö±â¼ú°³¹ß»ç¾÷"  | 
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 116  | 
 "Áö´ÉÇü ¹ÝµµÃ¼¸¦ À§ÇÑ Å×½ºÆ® ȸ·Î ¼³°è ±â¼ú"  | 
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 115  | 
 "ÀÎ-¸Þ¸ð¸® ÄÄÇ»ÆÃÀÇ ·Î¹ö½ºÆ®´Ï½º Çâ»óÀ» À§ÇÑ ¹ÝµµÃ¼ ¼³°è ±â¼ú"  | 
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 114  | 
 "¸Þ¸ð¸®Çâ RTL ±â¹Ý DFT ¹æ¹ý·Ð ÃÖÀûÈ"  | 
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 113  | 
 "Â÷¼¼´ë ¹ÝµµÃ¼ Å×½ºÆ® ÇÉ °¨¼Ò¸¦ À§ÇÑ Built Off Self Test(BOST) ±â¼ú ¿¬±¸"  | 
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 112  | 
 "¼öÀ² Çâ»óÀ» À§ÇÑ DFT ±¸Á¶ ¼³°è"  | 
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 111  | 
 "Statistical DRAM fault ¸ðµ¨¸µ°ú ÀÌ¿¡ ±â¹ÝÇÑ fault »ý¼º ±â¼ú °³¹ß"  | 
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 110  | 
 "TSV ±â¹Ý 3D ICÀÇ ¼öÀ² Çâ»óÀ» À§ÇÑ Å×½ºÆ® ¹× Å×½ºÅÍ ±â¼ú"  | 
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 109  | 
 "½º¸¶Æ® ¼¾¼ SoC¿ë ÃÊÀúÀü¾Ð ȸ·Î ¹× IP ¼³°è ±â¼ú °³¹ß"  | 
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 108  | 
 "µ¥ÀÌÅÍ Á᫐ ¾îÇø®ÄÉÀ̼ÇÀ» À§ÇÑ PIM ÄÚ¾î ±â¼ú ¹× ½Ã½ºÅÛ °³¹ß"  | 
| 
 107  | 
 "HPC ½Ã½ºÅÛ ÀÀ¿ë ÇÁ·Î±×·¥ ÃÖÀûȸ¦ À§ÇÑ °³¹ßµµ±¸"  | 
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 106  | 
 "Ãʹ̼¼Æø 3Â÷¿ø ¹ÝµµÃ¼ Á¦Á¶ºñ¿ë Àý°¨À» À§ÇÑ ¼³°è ¹× Å×½ºÆ® ±â¼ú ¿¬±¸"  | 
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 105  | 
 "Test Parallelism È®´ë¸¦ À§ÇÑ SoC Self-Test Methodology °³¹ß"  | 
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 104  | 
 "¼öÀ² Çâ»óÀ» À§ÇÑ 2D BIRA±â¼ú¿¬±¸"  | 
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 103  | 
 "DFT Utility Development"  | 
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 102  | 
 "Speed up scan shifting frequency using low power scan stitching method"  | 
| 
 101  | 
 "Ãʹ̼¼Æø 3Â÷¿ø ¹ÝµµÃ¼ Á¦Á¶ºñ¿ë Àý°¨À» À§ÇÑ ¼³°è ¹× Å×½ºÆ® ±â¼ú ¿¬±¸"  | 
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 100  | 
 "Logic¼³°è code/function °ËÁõ coverage °³¼± ¹æ¹ý ¿¬±¸"  | 
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 99  | 
 "½º¸¶Æ® ÀÚµ¿Â÷¸¦ À§ÇÑ AUTOSAR ±â¹Ý Â÷·® ³»¿ÜºÎ Åë½Å Ç÷§Æû ¹× ÀÀ¿ë ±â¼ú"  | 
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 98  | 
 "º´·Äºñ±³ High speed I/O Å×½ºÆ® ±â¹ý °³¹ß"  | 
| 
 97  | 
 "Â÷¼¼´ë ¼±Ç༳°è(¸Þ¸ð¸®&System LSI)"  | 
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 96  | 
 "Massively Parallel Testing±â¹ý¿¡ °üÇÑ ¿¬±¸ "  | 
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 95  | 
 "Multicore ȯ°æÀ» À§ÇÑ DVS ±â¼ú °³¹ß"  | 
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 94  | 
 "°íÈ¿À²ÀÇ ¸Þ¸ð¸® ÀÚü ¼ö¸® ¹æ¹ý·Ð °³¹ß"  | 
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 93  | 
 "Â÷¼¼´ë Ãʰí¼Ó Å×½ºÅ͸¦ À§ÇÑ ASIC Chip °³¹ß"  | 
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 92  | 
 "T-conÀÇ Å×½ºÆ® coverage ÃøÁ¤À» À§ÇÑ Å×½ºÆ® IP °³¹ß"  | 
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 91  | 
 "À£´Ï½º ÀÇ·ù ³»ÀåÇü »ýüÁ¤º¸ ¼¾¼ ¸ðµâ ¹× Àü¼Û ´Ü¸» ±â¼ú °³¹ß"  | 
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 90  | 
 "Memory Logic Simulatio IDE(ÅëÇÕ¼³°èȯ°æ) ±¸Ãà "  | 
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 89  | 
 "³×Æ®¿öÅ© °¡»óÈ¿¡¼ Ç÷οì ÇÁ·Î¼¼¼ Ȱ¿ë °¡´É¼º ºÐ¼® ¿¬±¸"  | 
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 88  | 
 "ÀúÀü·Â ¸ÖƼÄÚ¾î ÇÁ·Î¼¼¼ ±¸Á¶ ¿¬±¸"  | 
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 87  | 
 "°æ·Î Ž»ö ¾Ë°í¸®Áò¿¡ ´ëÇÑ IP ¼³°è »ç¾÷"  | 
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 86  | 
 "³×Æ®¿öÅ© ±â¹Ý ÀûÀÀ »ýÁ¸Çü ¹ÙÀÌ¿ÀÇÁ·Î¼¼¼ ¹× ÀÀ¿ë±â¼ú °³¹ß"  | 
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 85  | 
 "Áö´ÉÇü ³×ºñ°ÔÀÌÅÍ ¹× ½º¸¶Æ® BNP »ó¿ë±â¼ú °³¹ß"  | 
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 84  | 
 "Ç÷¡½Ã ¸Þ¸ð¸® ±â¹ÝÀÇ ÆÄÀÏ ½Ã½ºÅÛÀÇ ¾ÈÁ¤¼º Çâ»óÀ» À§ÇÑ °íÀå ºÐ¼®"  | 
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 83  | 
 "À£´Ï½º ÀÇ·ù ³»ÀåÇü »ýüÁ¤º¸ ¼¾¼ ¸ðµâ ¹× Àü¼Û ´Ü¸»"  | 
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 82  | 
 "Â÷¼¼´ë ¸Þ¸ð¸® ATE¸¦ À§ÇÑ È¿°úÀûÀÎ RA ¾Ë°í¸®Áò °³¹ß"  | 
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 81  | 
 "USB Åë½Å¿¡ ÀÇÇÑ ÆÐ³Î ¹× ±¤Æ¯¼º ÃøÁ¤ ÀåºñÀÇ ½Ç½Ã°£ Á¦¾î"  | 
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